Transient adjoint sensitivity analysis exploiting FDTD Conferences

authors

• Yu Zhang
• Bakr, Mohamed

status

• published 

publication date

• June 2012

published in

• IEEE MTT-S International Microwave Symposium Digest  Journal

presented at event

• 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012  Conference

keywords

• 40 Engineering
• 4006 Communications Engineering
• 4008 Electrical Engineering

Digital Object Identifier (DOI)

• 10.1109/mwsym.2012.6259375

start page

• 1

end page

• 3