Conference
Transient adjoint sensitivity analysis exploiting FDTD
Abstract
Authors
Zhang Y; Bakr MH
Pagination
pp. 1-3
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
October 3, 2012
DOI
10.1109/mwsym.2012.6259375
Name of conference
2012 IEEE/MTT-S International Microwave Symposium Digest
Conference proceedings
IEEE MTT-S International Microwave Symposium digest
ISSN
0149-645X