Conference
Image Quality Enhancement in the Microwave Raster Scanning Method
Abstract
Authors
Khalatpour A; Amineh RK; Xu H; Baskharoun Y; Nikolova NK
Pagination
pp. 1-4
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2011
DOI
10.1109/mwsym.2011.5972875
Name of conference
2011 IEEE MTT-S International Microwave Symposium