Conference
Central-Node Approach for Accurate Self-Adjoint Sensitivity Analysis of Dielectric Structures
Abstract
Authors
Song Y; Nikolova NK
Pagination
pp. 895-898
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2007
DOI
10.1109/mwsym.2007.380124
Name of conference
2007 IEEE/MTT-S International Microwave Symposium
Conference proceedings
IEEE MTT-S International Microwave Symposium digest
ISSN
0149-645X