Conference
Sensitivity-based Microwave Imaging with Raster Scanning
Abstract
Authors
Zhang Y; Tu S; Amineh RK; Nikolova NK
Volume
1
Pagination
pp. 1-3
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2012
DOI
10.1109/mwsym.2012.6258250
Name of conference
2012 IEEE/MTT-S International Microwave Symposium Digest