Conference
Re-discovering Adjoint Sensitivities: Toward Field-based Analysis
Abstract
Computing the derivatives of the scattering parameters of microwave devices with respect to shape and material parameters is a problem of significant interest in high-frequency computer-aided design. The pioneering work of Bandler, Monaco, Tiberio and others in the late 1960s and the early 1970s brought about the circuit-based sensitivity analysis of microwave networks. Here, we discuss some of the recent developments in adjoint sensitivities …
Authors
Nikolova NK; Dadash MS; Bakr MH; Zhang Q-I
Volume
1
Pagination
pp. 1-3
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2012
DOI
10.1109/mwsym.2012.6259447
Name of conference
2012 IEEE/MTT-S International Microwave Symposium Digest