Conference
POOR CONFINEMENT OF E-H RECOMBINATION ZONE IN BLUE OLEDS
Abstract
Authors
Sadek T; Aziz H; Loutfy RO; Smith PM
Pagination
pp. 1117-1120
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2008
DOI
10.1109/ccece.2008.4564711
Name of conference
2008 Canadian Conference on Electrical and Computer Engineering
Conference proceedings
2006 Canadian Conference on Electrical and Computer Engineering
ISSN
0840-7789