Conference
Hasse Diagrams of Combined Traces
Abstract
Authors
Mikulski L; Koutny M
Pagination
pp. 92-101
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2012
DOI
10.1109/acsd.2012.9
Name of conference
2012 12th International Conference on Application of Concurrency to System Design