Conference
Discrete event systems modeling and control of a manufacturing testbed
Abstract
Authors
Leduc RJ; Wonham WM
Volume
2
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 1995
DOI
10.1109/ccece.1995.526414
Name of conference
Proceedings 1995 Canadian Conference on Electrical and Computer Engineering
Conference proceedings
2006 Canadian Conference on Electrical and Computer Engineering
ISSN
0840-7789