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DATE 07 workshop on diagnostic services in NoCs
Conference

DATE 07 workshop on diagnostic services in NoCs

Abstract

The Workshop on Diagnostic Services in Network-on-Chips, held during DATE 2007, focused on test, debugging, and online monitoring in NoCs. The main body of the workshop was formed by two sessions with full-length paper presentations and two lively poster sessions with a total of 28 posters. EPFL's Giovanni De Micheli gave the keynote address, and the workshop also featured a panel session led by Tensilica's Grant Martin and invited talks by Virage Logic's Yervant Zorian and NXP Semiconductors' Kees Goossens. The workshop produced electronic online proceedings, including papers, slides, and posters-totaling 420 pages.

Authors

Marinissen EJ; Jantsch A; Nicolici N

Volume

24

Pagination

pp. 510-510

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

January 1, 2007

DOI

10.1109/mdt.2007.162

Conference proceedings

IEEE Design and Test

Issue

5

ISSN

2168-2356

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