Bit-flip detection-driven selection of trace signals Conferences

authors

• Vali, Amin
• Nicolici, Nicola

status

• published 

publication date

• May 2016

has subject area

• 08 Information and Computing Sciences (FoR)
• 09 Engineering (FoR)

published in

• Proceedings of the European Test Workshop  Journal

presented at event

• 2016 IEEE European Test Symposium (ETS)  Conference

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 4009 Electronics, Sensors and Digital Hardware

Digital Object Identifier (DOI)

• 10.1109/ets.2016.7519315

start page

• 1

end page

• 6

volume

• 2016-July