Bit-Flip Detection-Driven Selection of Trace Signals

Analyzing the traces that are collected on-chip is an effective method employed during post-silicon validation. Deciding at design time which signals to trace at the post-silicon phase, has been posed as an algorithmic problem several years ago. The primary focus of the subsequent approaches on this topic was to restore data in order to facilitate functional debugging. In this paper we show that analyzing post-silicon traces can also aid with the identification of electrically-induced design errors, e.g., bit-flips. We present a new trace signals selection algorithm that is driven by the detection of bit-flips.