Conference
Measuring the silion fluoride bond distance in zeolites
Abstract
A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side band intensity fitting give shorter Si-F bond distances than …
Authors
Darton RJ; Brouwer DH; Fyfe CA; Villaescusa LA; Morris RE
Series
Studies in Surface Science and Catalysis
Volume
154
Pagination
pp. 1319-1323
Publisher
Elsevier
Publication Date
2004
DOI
10.1016/s0167-2991(04)80644-x
Conference proceedings
Studies in Surface Science and Catalysis
ISSN
0167-2991