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Dielectric Modulated Triple Metal Gate All Around...
Conference

Dielectric Modulated Triple Metal Gate All Around MOSFET (TMGAA) for DNA Bio-Molecule Detection

Authors

Goel A; Rewari S; Verma S; Gupta RS

Editors

Sarkar A; Chanda M

Pagination

pp. 337-340

Publisher

IEEE

Publication Date

2018

Name of conference

IEEE International Conference on Electron Device Kolkata Conference (EDKCON)

Conference place

INDIA, Kolkata

Conference start date

November 24, 2018

Conference end date

November 25, 2018

Conference proceedings

PROCEEDINGS OF 2018 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES KOLKATA CONFERENCE (IEEE EDKCON)