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Recent Developments in Integrated Spectrometers
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Recent Developments in Integrated Spectrometers

Abstract

In the 1990's, the Institute for Microstructural Sciences has maintained a research project on Wavelength Division Multiplexing (WDM) based on integrated echelle gratings spectrometers. Major obstacles to the application of these spectrometers to telecommunications, such as channel wavelength accuracy, insertion loss, birefringence, polarisation dependent loss, compliance to flat band, and crosstalk, have been largely resolved. This technology …

Authors

Delâge A; Bidnyk S; Cheben P; Dossou K; Janz S; Lamontagne B; Packirisamy M; Xu D-X

Volume

2

Pagination

pp. 78-83

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

January 1, 2004

DOI

10.1109/icton.2004.1361973

Name of conference

Proceedings of 2004 6th International Conference on Transparent Optical Networks (IEEE Cat. No.04EX804)