Conference
Sensor Placement for Fault Diagnosis Using Genetic Algorithm
Abstract
This paper presents a novel methodology for the purpose of fault detection and isolation (FDI) to a two–tank system. This new methodology benefits from the basic facts that faults are embedded in the analytical redundancy relations (ARRs) and that the occurrence of a fault will cause the corresponding ARRs to change. Based on these facts, the minimal isolation set as an important concept is introduced to make each fault in the fault set F …
Authors
Chi G; Wang D; Yu M; Alavi M; Le T; Luo M
Pagination
pp. 1-7
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2012
DOI
10.1109/etfa.2012.6489615
Name of conference
Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation (ETFA 2012)