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Scan Latch Partitioning into Multiple Scan Chains for Power Minimization in Full Scan Sequential Circuits
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Additional Document Info
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Overview
authors
Nicolici, Nicola
Al-Hashimi, M
status
accepted
publication date
January 1, 2000
published in
Proceedings -Design, Automation and Test in Europe, DATE
Journal
presented at event
Meeting on Design Automation and Test in Europe
Conference
Research
keywords
40 Engineering
4008 Electrical Engineering
4009 Electronics, Sensors and Digital Hardware
Identity
Digital Object Identifier (DOI)
10.1109/DATE.2000.840866
International Standard Book Number (ISBN) 10
0-7695-0537-6
Additional Document Info
start page
715
end page
722