Embedded Deterministic Test Exploiting Care Bit Clustering and Seed Borrowing Conferences

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authors

Kinsman, Adam
Nicolici, Nicola

status

published

publication date

March 2008

published in

9th International Symposium on Quality Electronic Design (isqed 2008) Journal

presented at event

2008 9th International Symposium of Quality of Electronic Design (ISQED) Conference