Home
Scholarly Works
Embedded Deterministic Test Exploiting Care Bit...
Conference
Embedded Deterministic Test Exploiting Care Bit Clustering and Seed Borrowing
Authors
Kinsman A; Nicolici N
Pagination
pp. 832-837
Publication Date
March 1, 2008
DOI
10.1109/ISQED.2008.4479846
Associated Experts
Nicola Nicolici
Professor, Faculty of Engineering
Visit profile
Labels
Fields of Research (FoR)
46 Information and Computing Sciences
40 Engineering
4008 Electrical Engineering
View published work (Non-McMaster Users)
Scholarly citations from Dimensions
Contact the Experts team
Get technical help
or
Provide website feedback