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Embedded Deterministic Test Exploiting Care Bit...
Conference
Embedded Deterministic Test Exploiting Care Bit Clustering and Seed Borrowing
Authors
Kinsman A; Nicolici N
Pagination
pp. 832-837
DOI
10.1109/ISQED.2008.4479846
Associated Experts
Nicola Nicolici
Professor, Faculty of Engineering
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Labels
Fields of Research (FoR)
46 Information and Computing Sciences
40 Engineering
4008 Electrical Engineering
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