Conference
Hybrid Diagnosis of Intern-Turn Short-Circuit for Aircraft Applications Using SVM - MBF
Abstract
Authors
Breuneva R; Clerc G; Nahid-Mobarakeh B; Mansouri B
Pagination
pp. 1-6
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 1, 2017
DOI
10.1109/fuzz-ieee.2017.8015588
Name of conference
2017 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE)