Extraction of the channel thermal noise in MOSFETs Conferences

authors

• Chen, Chih-hung
• Deen, Jamal
• Matloubian, Mishel
• Cheng, Yuhua

status

• accepted 

publication date

• January 1, 2000

published in

• ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)  Journal

presented at event

• ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures  Conference

keywords

• 40 Engineering
• 4008 Electrical Engineering

Digital Object Identifier (DOI)

• 10.1109/ICMTS.2000.844403

start page

• 42

end page

• 47