System aware DUT design for optimum on-wafer noise measurement Conferences

Overview
Research
Identity
Additional Document Info
View All

authors

Chen, Chih-hung
Yang, Benson
Chu, Pei-Hsien
Brown, Graham
Das, Saswati

status

published

publication date

March 2018

published in

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) Journal

presented at event

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) Conference