Thermal noise performance in recent CMOS technologies Conferences

authors

• Chen, Chih-hung
• Bigchoug Hung
• Sheng-Yi Huang
• Jin-Shyong Jan
• Liang, Victor
• Chune-Sin. Yeh

status

• published 

publication date

• October 2008

published in

• 2008 9th International Conference on Solid-State and Integrated-Circuit Technology  Journal

presented at event

• 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT)  Conference

keywords

• BAND
• CHANNEL NOISE
• EXTRACTION
• Engineering
• Engineering, Electrical & Electronic
• GAAS-MESFETS
• HIGH-FREQUENCY NOISE
• MODEL
• PARAMETERS
• Physical Sciences
• Physics
• Physics, Applied
• RF NOISE
• SILICON
• SUBMICRON MOSFETS
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1109/icsict.2008.4734584

International Standard Book Number (ISBN) 13

• 978-1-4244-2185-5

start page

• 476

end page

• +