Conference
Challenges in HF noise characterization and modeling of sub-100nm MOSFETs for RF ICs
Authors
Chen C-H; Zeng Z; Jan J-S; Wang K-C; Yeh C-S
Volume
6600
Publisher
SPIE, the international society for optics and photonics
Publication Date
June 7, 2007
DOI
10.1117/12.725641
Name of conference
Noise and Fluctuations in Circuits, Devices, and Materials
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X