Challenges in HF noise characterization and modeling of sub-100nm MOSFETs for RF ICs Conferences uri icon

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authors

  • Chen, Chih-hung
  • Zeng, Zheng
  • Jan, Jin-Shyong
  • Wang, Keh-Chung
  • Yeh, Chune-Sin

publication date

  • June 7, 2007