Channel thermal noise and its scaling impact on deep sub-100nm MOSFETs Conferences

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authors

Ge Tan
Chen, Chih-hung
Bigchoug Hung
Peiming Lei
Chune-Sin Yeh

status

published

publication date

June 2011

published in

2011 21st International Conference on Noise and Fluctuations Journal

presented at event

2011 21st International Conference on Noise and Fluctuations (ICNF) Conference