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Applications of aberration-corrected TEM–STEM and...
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Applications of aberration-corrected TEM–STEM and high-resolution EELS in materials research

Authors

Botton G; Maunders C; Gunawan L; Cui K; Chang L; Lazar S

Volume

64

Pagination

pp. c66-c66

Publisher

International Union of Crystallography (IUCr)

Publication Date

August 23, 2008

DOI

10.1107/s0108767308097894

Conference proceedings

Acta Crystallographica Section A: Foundations and advances

Issue

a1

ISSN

0108-7673

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