Conference
A robust approach to discard feature outliers using M-estimator method
Authors
Li XW; Liu Y; Wang YT; Zheng W
Editors
Tan JE; Wen XA
Pagination
pp. 265-268
Publisher
HARBIN INSTITUTE TECHNOLOGY PUBLISHERS
Publication Date
2004
ISBN-10
7-5603-2056-2
Name of conference
3rd International Symposium on Instrumentation Science and Technology
Conference place
PEOPLES R CHINA, Xian
Conference start date
August 18, 2004
Conference end date
August 22, 2004
Conference proceedings
PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, VOL 2