Nanopipes in GaN: photo-etching and TEM study Conferences

authors

• Lazar, Sorin
• Weyher, JL
• Macht, L
• Tichelaar, FD
• Zandbergen, HW

status

• published 

publication date

• July 2004

has subject area

• 01 Mathematical Sciences (FoR)
• 02 Physical Sciences (FoR)
• Applied Physics (Science Metrix)

published in

• EPJ Applied Physics  Journal

presented at event

• 10th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP 10)  Conference

keywords

• ATOMIC-FORCE MICROSCOPY
• DEFECTS
• DISLOCATIONS
• FILMS
• GROWTH
• Physical Sciences
• Physics
• Physics, Applied
• SAPPHIRE
• Science & Technology
• TRANSMISSION ELECTRON-MICROSCOPY

Digital Object Identifier (DOI)

• 10.1051/epjap:2004047

start page

• 275

end page

• 278

volume

• 27

issue

• 1-3