Journal article
Revealing the Effects of Trace Oxygen Vacancies on Improper Ferroelectric Manganite with In Situ Biasing
Abstract
Authors
Cheng S; Meng Q; Han M; Deng S; Li X; Zhang Q; Tan G; Botton GA; Zhu Y
Journal
Advanced Electronic Materials, Vol. 5, No. 4,
Publisher
Wiley
Publication Date
April 1, 2019
DOI
10.1002/aelm.201800827
ISSN
2199-160X