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About the origin and the mechanisms involved in...
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About the origin and the mechanisms involved in the cracking of highly porous silicon layers under capillary stresses

Abstract

The effects of the capillary stresses during the drying of p + -type porous silicon (PS) layers are reported. The cracking of the PS layers occurs for samples thicker than a critical thickness value hc. Taking into account the elastic properties of p + -type PS material, a simple model shows that hc varies as (1 − p)3 and 1/γLV2, where p is the porosity and γLV is the surface tension of the drying liquid. A good agreement with experimental results is observed. This study leads also to a very easy and simple method which increases the hc value by a factor of about 25 when using pentane as the drying liquid (instead of water).

Authors

Belmont O; Faivre C; Bellet D; Brechet Y

Volume

276

Pagination

pp. 219-222

Publisher

Elsevier

Publication Date

April 15, 1996

DOI

10.1016/0040-6090(95)08057-0

Conference proceedings

Thin Solid Films

Issue

1-2

ISSN

0040-6090

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