Quantitative evolution of electrical contact resistance between aluminum thin films Conferences uri icon

  •  
  • Overview
  •  
  • Research
  •  
  • Additional Document Info
  •  
  • View All
  •  

authors

  • Mercier, David
  • Mandrillon, Vincent
  • Holtz, Anthony
  • Volpi, Fabien
  • Verdier, Marc
  • Brechet, Yves

publication date

  • January 1, 2012