Conference
Binary CEO Problem under Log-Loss with BSC Test-Channel Model
Abstract
Authors
Nangir; Asvadi R; Ahmadian-Attari M; Chen J
Volume
00
Pagination
pp. 1-5
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 7, 2018
DOI
10.1109/bsc.2018.8494699
Name of conference
2018 29th Biennial Symposium on Communications (BSC)