authors Mokhtari, Merwan Pagnod-Rossiaux, Philippe Laruelle, Francois Landesman, Jean-Pierre Moreac, Alain Levallois, Christophe Cassidy, Daniel Thomas
has subject area 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics (FoR) 0906 Electrical and Electronic Engineering (FoR) 1099 Other Technology (FoR) Applied Physics (Science Metrix)
presented at event 17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP) Conference
keywords Engineering Engineering, Electrical & Electronic GAAS Materials Science Materials Science, Multidisciplinary OXIDATION Physical Sciences Physics Physics, Applied RELIABILITY STRESS Science & Technology Technology VCSEL oxide aperture quantum well reliability residual stress