Conference
Data-Driven Quality Control of Batch Processes via Subspace Identification
Abstract
Authors
Corbett B; Mhaskar P
Pagination
pp. 4163-4168
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 1, 2016
DOI
10.1109/acc.2016.7525576
Name of conference
2016 American Control Conference (ACC)