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Impedance spectroscopy characterization of GaAs...
Conference

Impedance spectroscopy characterization of GaAs nanowire bundles grown by metal-catalyzed molecular beam epitaxy

Abstract

Vertically aligned GaAs nanowire (NW) bundles grown by gas-source molecular beam epitaxy on an n-doped GaAs substrate by a metal catalysis method and embedded in an insulating matrix (SU8-2) were studied by impedance spectroscopy. The DC current–voltage characteristics measured between Au dot contacts to the NW tips and the substrate exhibited Schottky behavior. A detailed analysis of the impedance data measured in reverse bias conditions is …

Authors

Tirado M; Comedi D; LaPierre RR

Volume

495

Pagination

pp. 443-445

Publisher

Elsevier

Publication Date

April 2010

DOI

10.1016/j.jallcom.2009.10.084

Conference proceedings

Journal of Alloys and Compounds

Issue

2

ISSN

0925-8388