Structural and compositional study of Erbium-doped silicon nanocrystals by HAADF, EELS and HRTEM techniques in an aberration corrected STEM Conference Paper uri icon

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authors

  • Kashtiban, RJ
  • Bangert, U
  • Crowe, I
  • Halsall, MP
  • Sherliker, B
  • Harvey, AJ
  • Eccles, J
  • Knights, Andrew
  • Gwilliam, R
  • Gass, M

publication date

  • February 1, 2010