authors
- Smith, AJ
- Antwis, LD
- Yeong, SH
- Knights, Andrew
- Colombeau, B
- Sealy, BJ
- Gwilliam, RM
- Seebauer, Edmund G
- Felch, Susan B
- Jain, Amitabh
- Kondratenko, Yevgeniy V
Junction Leakage Analysis of Vacancy Engineered Ultra-Shallow p-type Layers
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