Conference
Size limit on the phosphorous doped silicon nanocrystals for dopant activation
Abstract
We studied the photoluminescence spectra of silicon nanocrystals doped with and without phosphorus as a function of isothermal annealing time. Silicon nanocrystals were prepared by the implantation of 80keV Si+ into a 500nm SiO2 film to an areal density of 8×1016 at/cm2. Half of the samples were co-implanted with P+ at 80keV to 5×1015 at/cm2. The photoluminescence of the annealed samples were photo-excited at wavelength of 405nm. For short …
Authors
Yang P; Gwilliam RM; Crowe IF; Papachristodoulou N; Halsall MP; Hylton NP; Hulko O; Knights AP; Shah M; Kenyon AJ
Volume
307
Pagination
pp. 456-458
Publisher
Elsevier
Publication Date
7 2013
DOI
10.1016/j.nimb.2012.12.077
Conference proceedings
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
ISSN
0168-583X