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Size limit on the phosphorous doped silicon...
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Size limit on the phosphorous doped silicon nanocrystals for dopant activation

Abstract

We studied the photoluminescence spectra of silicon nanocrystals doped with and without phosphorus as a function of isothermal annealing time. Silicon nanocrystals were prepared by the implantation of 80keV Si+ into a 500nm SiO2 film to an areal density of 8×1016 at/cm2. Half of the samples were co-implanted with P+ at 80keV to 5×1015 at/cm2. The photoluminescence of the annealed samples were photo-excited at wavelength of 405nm. For short …

Authors

Yang P; Gwilliam RM; Crowe IF; Papachristodoulou N; Halsall MP; Hylton NP; Hulko O; Knights AP; Shah M; Kenyon AJ

Volume

307

Pagination

pp. 456-458

Publisher

Elsevier

Publication Date

7 2013

DOI

10.1016/j.nimb.2012.12.077

Conference proceedings

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

ISSN

0168-583X