Conference
A Comparison of Radar Altimetry and Repeat Pass Interferometry as Methods of Producing Digital Terrain Elevation Models
Abstract
Authors
Markham KJ; Morris WA
Volume
6
Pagination
pp. 3620-3622
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2002
DOI
10.1109/igarss.2002.1027269
Name of conference
IEEE International Geoscience and Remote Sensing Symposium