Conference
FDTD-Based Transient Adjoint Sensitivity Analysis
Abstract
Authors
Zhang Y; Bakr MH
Pagination
pp. 1-3
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
August 1, 2015
DOI
10.1109/nemo.2015.7415081
Name of conference
2015 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)