Conference
Single Image Depth Estimation Using Joint Local-Global Features
Abstract
Authors
Mohaghegh H; Karimi N; Soroushmehr SMR; Samavi S; Najarian K
Pagination
pp. 727-732
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2016
DOI
10.1109/icpr.2016.7899721
Name of conference
2016 23rd International Conference on Pattern Recognition (ICPR)