Conference
Sparsity Fine Tuning in Wavelet Domain With Application to Compressive Image Reconstruction
Abstract
Authors
Dong W; Wu X; Shi G
Volume
23
Pagination
pp. 5249-5262
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 1, 2014
DOI
10.1109/tip.2014.2363616
Conference proceedings
IEEE Transactions on Image Processing
Issue
12
ISSN
1057-7149