Conference
Context-Based Bias Removal of Statistical Models of Wavelet Coefficients for Image Denoising
Abstract
Authors
Dong W; Wu X; Shi G; Zhang L
Pagination
pp. 3841-3844
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2009
DOI
10.1109/icip.2009.5414255
Name of conference
2009 16th IEEE International Conference on Image Processing (ICIP)