Conference
MDL Context Modeling of Images with Application to Denoising
Abstract
The lately popularized patch-based nonlocal (NL) image processing approach is cast into a framework of statistical context modeling, a thoroughly studied topic in data compression and information theory. The adaptation of image patch (context) to local waveform is crucial to the performance of NL-type of image processing but yet lacks a rigorous study. In this paper we propose a minimum description length (MDL) approach for choosing the size …
Authors
Zhai G; Wu X; Yang X; Zhang W
Pagination
pp. 3845-3848
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2009
DOI
10.1109/icip.2009.5414252
Name of conference
2009 16th IEEE International Conference on Image Processing (ICIP)