Conference
Accurate characterization of doped semiconductors with terahertz spectroscopy
Authors
Ahmed OS; Swillam MA; Bakr MH; Li X
Volume
8007
Publisher
SPIE, the international society for optics and photonics
Publication Date
June 1, 2011
DOI
10.1117/12.905581
Name of conference
Photonics North 2011
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X