Journal article
Predicting Time to Failure Using the IMM and Excitable Tests
Abstract
Authors
Phelps E; Willett P; Kirubarajan T; Brideau C
Journal
IEEE Transactions on Systems Man and Cybernetics Systems, Vol. 37, No. 5, pp. 630–642
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2007
DOI
10.1109/tsmca.2007.902621
ISSN
2168-2216