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Predicting Time to Failure Using the IMM and...
Journal article

Predicting Time to Failure Using the IMM and Excitable Tests

Abstract

Prognostics, which refers to the inference of an expected time to failure for a system, is made difficult by the need to track and predict the trajectories of real-valued system parameters over essentially unbounded domains and by the need to prescribe a subset of these domains in which an alarm should be raised. In this paper, we propose an idea, one whereby these problems are avoided: Instead of physical system or sensor parameters, a vector …

Authors

Phelps E; Willett P; Kirubarajan T; Brideau C

Journal

IEEE Transactions on Systems Man and Cybernetics Systems, Vol. 37, No. 5, pp. 630–642

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

September 1, 2007

DOI

10.1109/tsmca.2007.902621

ISSN

2168-2216