The intrinsic degradation of
tris(8-hydroxyquinoline) aluminum (AlQ3)-based organic light emitting devices, that leads to the long-term decrease in the electroluminescence efficiency of the devices operated under constant current conditions, is studied. The injection of holes in A1Q3 is found to be the main factor responsible for device degradation. OLEDs with dual HTLs in different arrangements are also presented to demonstrate the proposed degradation mechanism. The role of various approaches to increase OLED lifetime, such as, doping the hole transport layer, introducing a buffer layer at the hole-injecting contact, or using a mixed emitting layer of hole and electron transporting molecules, is explained.