Embedded compact deterministic test for IP-protected cores Conferences

authors

• Kinsman, AB
• Hewitt, JI
• Nicolici, Nicola

status

• accepted 

publication date

• January 1, 2003

published in

• Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Journal

presented at event

• 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Conference

keywords

• Computer Science
• Computer Science, Hardware & Architecture
• Engineering
• Engineering, Electrical & Electronic
• SEQUENCES
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1109/dftvs.2003.1250151

International Standard Book Number (ISBN) 10

• 0-7695-2042-1

start page

• 519

end page

• 526