Power-constrained embedded memory BIST architecture Conferences

authors

• Fang, BH
• Nicolici, Nicola

status

• published 

publication date

• January 1, 2003

published in

• Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Journal

presented at event

• 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Conference

keywords

• Computer Science
• Computer Science, Hardware & Architecture
• Engineering
• Engineering, Electrical & Electronic
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1109/TSM.2005.1250143

International Standard Book Number (ISBN) 10

• 0-7695-2042-1

start page

• 451

end page

• 458

volume

• 2003-January