Conference
In-System Constrained-Random Stimuli Generation for Post-Silicon Validation
Abstract
Authors
Kinsman AB; Ko HF; Nicolici N
Volume
1
Pagination
pp. 1-10
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2012
DOI
10.1109/test.2012.6401541
Name of conference
2012 IEEE International Test Conference