Toggle navigation
Home
People
Departments
Research
About
Login
Search
In-system constrained-random stimuli generation for post-silicon validation
Conferences
Overview
Research
Identity
Additional Document Info
View All
Overview
authors
Kinsman, Adam B
Ko, Ho Fai
Nicolici, Nicola
status
published
publication date
November 2012
published in
IEEE International Test Conference (TC)
Journal
presented at event
2012 IEEE International Test Conference (ITC)
Conference
Research
keywords
Engineering
Engineering, Electrical & Electronic
Science & Technology
Technology
Identity
Digital Object Identifier (DOI)
10.1109/test.2012.6401541
Additional Document Info
volume
1