Scan architecture for shift and capture cycle power reduction Conferences

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authors

Rosinger, PM
Al-Hashimi, BM
Nicolici, Nicola

status

accepted

publication date

2002

published in

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Journal

presented at event

17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002 Conference