Bit-flip Detection-Driven Selection of Trace Signals Conferences
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Overview
status
publication date
- January 1, 2016
has subject area
- 0906 Electrical and Electronic Engineering (FoR)
- 1006 Computer Hardware (FoR)
- Computer Hardware & Architecture (Science Metrix)
published in
presented at event
- 21st IEEE European Test Symposium (ETS) Conference