Modular SOC testing with reduced wrapper count Conferences

authors

• Qiang Xu
• Nicolici, Nicola

status

• published 

publication date

• December 2005

has subject area

• 0906 Electrical and Electronic Engineering (FoR)
• 1006 Computer Hardware (FoR)
• Computer Hardware & Architecture (Science Metrix)

published in

• IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  Journal

presented at event

• 34th International Test Conference  Conference

keywords

• Computer Science
• Computer Science, Hardware & Architecture
• Computer Science, Interdisciplinary Applications
• Engineering
• Engineering, Electrical & Electronic
• Science & Technology
• Technology
• core wrapper
• electronic test
• system-on-a-chip (SOC)

Digital Object Identifier (DOI)

• 10.1109/tcad.2005.852447

start page

• 1894

end page

• 1908

volume

• 24

issue

• 12